Si5975DC
Vishay Siliconix
SPECIFICATIONS T J = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Min.
Typ.
Max.
Unit
Static
Gate Threshold Voltage
Gate-Body Leakage
Zero Gate Voltage Drain Current
On-State Drain Current a
V GS(th)
I GSS
I DSS
I D(on)
V DS = V GS , I D = - 1 mA
V DS = 0 V, V GS = ± 8 V
V DS = - 9.6 V, V GS = 0 V
V DS = - 9.6 V, V GS = 0 V, T J = 85 °C
V DS ≤ - 5 V, V GS = - 4.5 V
V GS = - 4.5 V, I D = - 3.1 A
- 0.45
- 10
0.070
± 100
-1
-5
0.086
V
nA
μA
A
Drain-Source On-State Resistance a
R DS(on)
V GS = - 2.5 V, I D = - 2.5 A
0.100
0.127
Ω
V GS = - 1.8 V, I D = - 1.0 A
0.131
0.164
Forward Transconductance a
g fs
V DS = - 5 V, I D = - 3.1 A
8
S
Diode Forward Voltage
a
V SD
I S = - 0.9 A, V GS = 0 V
- 0.8
- 1.2
V
Dynamic b
Total Gate Charge
Q g
5.7
9
Gate-Source Charge
Gate-Drain Charge
Turn-On Delay Time
Q gs
Q gd
t d(on)
V DS = - 6 V, V GS = - 4.5 V, I D = - 3.1 A
1.2
1.2
10
15
nC
Rise Time
Turn-Off Delay Time
Fall Time
Source-Drain Reverse Recovery Time
t r
t d(off)
t f
t rr
V DD = - 6 V, R L = 6 Ω
I D ? - 1 A, V GEN = - 4.5 V, R g = 6 Ω
I F = - 0.9 A, dI/dt = 100 A/μs
20
31
26
40
30
45
40
60
ns
Notes:
a. Pulse test; pulse width ≤ 300 μs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
TYPICAL CHARACTERISTICS 25 °C, unless otherwise noted
10
8
V GS = 5 V thru 2.5 V
10
8
T C = - 55 °C
6
4
2
0
2V
1.5 V
1V
6
4
2
0
25 °C
125 °C
0.0
0.5
1.0
1.5
2.0
2.5
3.0
0.0
0.5
1.0
1.5
2.0
2.5
3.0
www.vishay.com
2
V DS - Drain-to-Source Voltage (V)
Output Characteristics
V GS - Gate-to-Source Voltage (V)
Transfer Characteristics
Document Number: 71320
S10-0936-Rev. C, 19-Apr-10
相关PDF资料
SI5980DU-T1-GE3 MOSFET N-CH 100V PPAK CHIPFET
SI6404DQ-T1-GE3 MOSFET N-CH 30V 8.6A 8TSSOP
SI6413DQ-T1-E3 MOSFET P-CH 20V 7.2A 8TSSOP
SI6423DQ-T1-GE3 MOSFET P-CH 12V 8.2A 8-TSSOP
SI6466ADQ-T1-GE3 MOSFET N-CH 20V 6.8A 8TSSOP
SI6467BDQ-T1-GE3 MOSFET P-CH 12V 6.8A 8TSSOP
SI6924AEDQ-T1-GE3 MOSFET N-CH 28V ESD 8-TSSOP
SI6926ADQ-T1-GE3 MOSFET DL N-CH 20V 4.5A 8-TSSOP
相关代理商/技术参数
SI5980DU-T1-GE3 功能描述:MOSFET 100V 2.5A 7.8W .567Ohms @ 10V RoHS:否 制造商:STMicroelectronics 晶体管极性:N-Channel 汲极/源极击穿电压:650 V 闸/源击穿电压:25 V 漏极连续电流:130 A 电阻汲极/源极 RDS(导通):0.014 Ohms 配置:Single 最大工作温度: 安装风格:Through Hole 封装 / 箱体:Max247 封装:Tube
SI5997DU-T1-GE3 功能描述:MOSFET 30V 6A 10.4W 54mOhms @ 10V RoHS:否 制造商:STMicroelectronics 晶体管极性:N-Channel 汲极/源极击穿电压:650 V 闸/源击穿电压:25 V 漏极连续电流:130 A 电阻汲极/源极 RDS(导通):0.014 Ohms 配置:Single 最大工作温度: 安装风格:Through Hole 封装 / 箱体:Max247 封装:Tube
SI5999EDU-T1-GE3 功能描述:MOSFET 20V 6A DUAL P-CH MOSFET RoHS:否 制造商:STMicroelectronics 晶体管极性:N-Channel 汲极/源极击穿电压:650 V 闸/源击穿电压:25 V 漏极连续电流:130 A 电阻汲极/源极 RDS(导通):0.014 Ohms 配置:Single 最大工作温度: 安装风格:Through Hole 封装 / 箱体:Max247 封装:Tube
SI-5L1.880G 制造商:HITACHIMETAL 功能描述:
Si5XX5X7-EVB 功能描述:时钟和定时器开发工具 XO / VCXO Device Evaluation Board RoHS:否 制造商:Texas Instruments 产品:Evaluation Modules 类型:Clock Conditioners 工具用于评估:LMK04100B 频率:122.8 MHz 工作电源电压:3.3 V
Si5XX-EVB 功能描述:时钟和定时器开发工具 Si5XX EVAL Board RoHS:否 制造商:Texas Instruments 产品:Evaluation Modules 类型:Clock Conditioners 工具用于评估:LMK04100B 频率:122.8 MHz 工作电源电压:3.3 V
Si5xx-PROG-EVB 功能描述:时钟和定时器开发工具 I2C Programmable Evaluation Kit RoHS:否 制造商:Texas Instruments 产品:Evaluation Modules 类型:Clock Conditioners 工具用于评估:LMK04100B 频率:122.8 MHz 工作电源电压:3.3 V
SI5XXUC-EVB 功能描述:XO & VCXO UNIVERSAL EVAL BOARD 制造商:silicon labs 系列:- 零件状态:在售 主要用途:计时,时钟振荡器 嵌入式:- 使用的 IC/零件:Si5xxUC 主要属性:- 辅助属性:- 所含物品:板 标准包装:1